Shen Jiaqi1，8， Ge Baozhen2，8， Han Peng3，8，Zhou Wu1，8， Su Mingxu1，8， Yu Haitao1，8， Wu Xuecheng4，8， Lyu Qieni2，8，Zhu Xiaoyang5，8， Liu Junjie6，8， Zhou Suhong7，8， Gao Yuan7，8
1.College of Physics， School of Energy and Power Engineering， University of Shanghai for Science and Technology， Shanghai 200093，China； 2.School of Precision Instrument and Opto-electronics Engineering， Tianjin University， Tianjin 300072， China； 3.School of Physics and Telecommunication Engineering， South China Normal University， Guangzhou 510006， China； 4.College of Energy Engineering， Zhejiang University， Hangzhou 310058， China； 5.Division of Nanotechnology Development， National Center for Nanoscience and Technology， Beijing 100190， China； 6.Center of Environmental Metrology， National Institute of Metrology， Beijing 100029， China； 7.Institute of Analysis and Testing， Beijing Academy of Science and Technology （Beijing Center for Physical & Chemical Analysis）， Beijing 100089， China； 8.Particle Characterization Committee， Chinese Society of Particuology， Beijing 100190， China
Abstract
Significance To provide reference for the further development of particle characterization techniques， process optimization， and improvement of industry standards， this paper reviews the research status of particle measurement technologies， summarizes the existing limitations， and proposes potential research directions.
Progress Over the past decade， particle measurement technologies have made great progress. In addition to conventional commercial particle measurement instruments such as laser particle size analyzers， nanoparticle size analyzers， and particle counters， many other measurement techniques， including imaging method， rainbow scattering， interferometric particle imaging， digital holography， and ultrasonic scattering， have been investigated and significantly developed. Among them， image-based measurement technology stands out prominently. Due to the rapid development of imaging devices， the concept of imaging method has undergone a significant transformation， enabling the trial and practical implementation of many novel ideas. Furthermore， with the continuous progress in measurement technologies， the standardization of reference materials and measurement methods has advanced in an orderly manner and yielded fruitful results.
Conclusions and Prospects It is proposed that particle measurement technologies can achieve systematic upgrading through the interdisciplinary integration of optical detection， microelectronic sensing， and computer image processing， and that mainstream measurement methods should be continuously iterated and optimized to effectively meet the rapid development demands of key fields. For complex particle systems， more advanced inversion algorithms and physical models should be developed. It is urgent to formulate national and international standards targeting multi-dimensional particle characteristics， including morphology and composition spectra， to secure the initiative in standard-setting. Measurement instruments should be developed towards higher resolution， higher sensitivity， and stronger anti-interference ability to meet the extreme requirements of cutting-edge fields. Particle sensors should be developed into intelligent nodes of the industrial internet， and an intelligent decision-making system covering the entire production chain based on particle data should be constructed. Furthermore， novel technologies and instruments applicable to the collection and in-situ analysis of living biological particles and extraterrestrial particulate matter should be developed.
Keywords： particle measurement technology； laser particle size analyzer； nanoparticle size analyzer； imaging method； ultrasonic method； reference materials
Get Citation:Shen Jianqi， Ge Baozhen， Han Peng， et al. Research progress in particle measurement technologies［J］. China Powder Science and Technology， 2027， 33（1）： 1-13.
Received:2026-06-25， Revised： 2026-07-02， Online： 2026-07-14。
Funding： The research was supported by the National Natural Science Foundation of China (Grant Nos. 52376163, 52376162, 52276167, 91741129, 51576177, 61975058, and 62275192).
CLC No.:T-19； TH71； TB44
Type Code:A
Serial No.:1008-5548（2027）01-0001-13
