（1. College of Chemical Engineering， China University of Petroleum （Beijing），Beijing 102249， China； 2. Division of Nano Metrology and Materials Measurement， National Institute of Metrology， Beijing 100013， China）
Abstract： To measure the size of nano-particles and sub-micron particles accurately by the new method of nano-particle tracking analysis, the sample concentration, shutter value, gain value, threshold value and so on were respectively adjusted in the experiment. The variation of experiment values were observed and were compared with nominal values. The influence of the factors on measurement was investigated and analyzed systematically. The results show that the influence of the factors on measurement is relatively large and has a certain regularity. In the use of nano-particle tracking analysis method, each factor should be considered adequately. The samples with fit concentration should be configured and parameters should be set reasonably so that the particle size can be measured accurately.
Keywords: nano-particle tracking analysis method; particle size; influence factor
中图分类号：TB99 文献标志码：A
文章编号：1008-5548（2014）06-0040-04
DOI:10.13732/j.issn.1008-5548.2014.06.009
收稿日期：2014-01-23， 修回日期：2014-02-26，在线出版时间：2014-12-22。
基金项目：国家科技支撑计划项目，编号：2011BAK15B05；国家纳米重大科学研究计划项目，编号：2011CB932802。
第一作者简介：国凯（1989—），男，硕士研究生，研究方向为纳米颗粒粒径测量。电话:18811386751，E-mail：guokai89@foxmail.com。
通信作者简介：刘俊杰（1975—），男，硕士，副研究员，研究方向为粒度、浊度计量。电话：010-64524974，E-mail：liujj@nim.ac.cn。
