In this paper,based on the light scattering technique, a novel total scatteing method is presented and a TSM particle analyzer for fine particle measurement is also developed,which can be used to measure the submicron particles or even smaller. Theoretical studies and experimental researches show that the lower measuring limits are 0.05μmor less, while the upper measuring limits may be 10-20μm.

Keywords：TSM particle analyzer;light scattering;total scattering.

DOI：10.13732/j.issn.1008-5548.1996.01.008