摘要：提出了一种新的、基于光散射原理的全散射测量法，并相应地发展了ＴＳＭ微粒测量仪，可用于亚微米或更小颗粒的测量。理论分析和实验研究指出，其测量下限可达0.05μｍ或更小一些，而上限约为10～20μｍ。

关键词：TSM微粒测量仪;光散射;全散射;

Abstract：In this paper , based on the light scattering technique, a novel total scatteingmethod is presented and a TSM particle analyzer for fine particle measurement is also developed.which can be used to measure the submicron particles or even smaller. Theoretical studies and experimental researches show that the lower measuring limits are 0. 05um or less, while the uppermeasuring limits may be 10 - 20um.

Key words：TSM particle analyzer;light scattering;total scattering.