摘要：应用计算机微观图像采集分析系统建立了一套对超细材料进行形状表征和粒度测量的方法。该方法克服以往图像法测量样本小 ,得不到正确粒度分布的弊端。通过对SiO₂ 标准物的粒度测定表明 :均匀、单分散的测量样片的制备是图像法准确测量和分析的关键。当测量图片在 6张以上 ,累积测量颗粒总数在 2 0 0个左右时 ,测量结果具有代表性。该系统用于测量的粒度范围为 0 .5 μm～ 1cm的粒子时 ,长度测量误差小于 5 % ,颗粒等面积直径测量偏差小于12 %。

关键词：微观图像;超细材料;粒度分布;

Abstract：A method to describe the shape and the granularity distribution of superfine materials by aid of computer micro graph gathering and analysis system is established in this paper． The method is used to measure the particle size ranged from 0.5μm to1.0cm，while the relative deviations of the length and the equivalent area diameter are below 5％ and12％ respectively．After applying the method to analysis the standard material SiO₂，the results and the measuring requirement are derived． Based on the wel-l preparation of the single-layer and wel-l distributed scatting samples，the representative and correct size dis tribution of practical system is obtained if the measured particle number in a photograph is larger than 6 and the accumulative measured particle number is over200．T he results show the defect that the measurement sample is small and the measurement result is not representative in the way of traditional micrograph and image analysis was overcome． 

Key words：micrograph；superfine particle；particle size distri butio