ISSN 1008-5548

CN 37-1316/TU

2004年10卷  第2期
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斜投影显微图像分析法测量片状颗粒厚度的研究

Research on Thickness Measurement of Sheet Particles with Microscopic lmage Analysis Method of Oblique Projection

Doi:10.13732/j.issn.1008-5548.2004.02.008
作者:窦彦玲,任中京,江海鹰

摘要: 与传统正投影显微图像分析方法不同,本文应用斜投影法通过变换观测颗粒群的角度,依据获得的光学显微镜下颗粒群的信息,推导出了颗粒群厚度的计算公式,并讨论了厚度分辨能力与倾斜角、放大倍数之间的关系,同时应用实例证明了该方法的可行性。

关键词:斜投影;显微图像分析;三维重构;体视学

Abstract: The token information of particle group under light microscope isobtained based on slant projection. The calculating formula of particle groupthickness is deduced, then the relation of thickness resolving power, slantangle and magnification is discussed. The feasibility of this method is provedthrough the example.

Keywords: oblique projection; micro-image analysis; three-dimensionareconstruction; stereology