摘要：测量下限是光散射颗粒测试技术的关键问题。本文通过理论 分析、比较归一化散射光强的分布图和构造方差函数 F (d )对颗粒散 射光的光强分布进行了定性和定量的讨论，对 Mie 散射向 R ayleigh 散射趋近的情况进行了分析,讨论了散射光光强大小的分布，分析了 测量不同粒径的颗粒的可行性，最终得到在入射光源是波长为 0.6328 μm 的 H e-N e 激光器的情况下，当粒径 d 取 200 nm 以上时， 不同粒径颗粒的 M ie 散射光强分布有较大差别，适合用静态光散射 的方法来判断颗粒粒径。 

关键词：颗粒；粒度；光散射；Mie 理论

Abstract ：The bottom boundary is the key point of the light scattering technique. The distribution of the intensity of light scattering was discussed qualitatively and quantitatively by theory analysis, comparison of normalized scattering intensity distribution maps and structuring a variance function F (d ), the relationship between the theory of Mie scattering and Rayleigh scattering was investigated. The feasibility of measuring particles of differentsize was analysed and the applicable scope ofstatic lightscattering principles were produced, if the particle size d was above 200 nm, there was more difference between the Mie scattering intensity distributions of pellet with different particle sizes, in the situation that incident light wave length was 0.6328 μm, it was appropriate to judge the particle size with the static lightscattering method. 

Keywords：particle; particle size; light scattering; Mie theory