摘要：为研究外界因素对绝缘子表面的动态积污的影响, 以ZS-35KV/6-8瓷棒形支柱绝缘子为研究对象, 利用DEM-CFD耦合方法模拟绝缘子表面动态积污过程, 使用离散元法综合分析粒径、风速大小、来流角度对积污的影响。结果表明:一定时间内, 绝缘子的表面积污率表面粘附的污秽颗粒数呈线性增长趋势;随着风速的增大, 颗粒粘附速率先增大, 然后逐渐减少, 粘附速率最大时对应的风速为最适合积污风速, 最适积污风速随粒径的增大近似呈对数分布;当来流角度为135°左右时, 颗粒粘附速率最大;绝缘子上表面积污受曳力影响较大, 下表面积污受重力沉降作用影响较大, 上表面污秽颗粒平均粒径比下表面污秽颗粒平均粒径较小。

关键词：绝缘子；动态积污；DEM-CFD 耦合方法；颗粒粘附速率

Abstract：In order to study the influence of external factors on the insulator dynamic contamination, the contamination process of ZS-35KV/6-8 solid core post insulator were studied using coupled methods of DEM and CFD, the effects of particle diameter, wind speed, coming angle of wind on contamination were investigated using discrete element method. The results show that in a certain period of time, the polluting area rate and the number of dirty particles adhered to the surface shows a linear increasing trend. The particle adhesion rate increases initially and then decreases gradually with the increase of wind speed. When the adhesion rate reaches the maximum, it has the optimum wind speed for pollution which showes a logarithmic distribution with the increase of particle diameter. When the coming angle is about 135 °, the pollution is the fastest. The contamination of upper surface is mainly influenced by free stream drag, and the contamination of lower surface is affected by gravity sedimentation most, then the average diameter of particles on the upper surface is smaller than that of particles on the lower surface.

Keywords: insulator；dynamic contamination；DEM-CFD method coupling method；particle adhesion rate